Electromigration in thin films and electronic devices
materials and reliability
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Word Count
85,000 words, Guess
Page Count
340 pages
Identifiers
- Internet Archiveelectromigration00kimc
- ISBN-101845699378
- ISBN-139781845699376
- ISBN-139780857093752
- ISBN-100857093754
and 7 more
- Library of Congress Control Number2011934923
- OCLC Control Number713610407
- OCLC Control Number880416293
- OCLC Control Number758543100
- Better World Books9781845699376
- Better World Books9780857093752
- Open LibraryOL25214345M
Classifications
- LCCTK7874 .E478 2011
- LCCTK7871.15.F5E4 2011
- LCCTA418.9.T45 E54 2010eb
Subjects
Series Statement
- Woodhead Publishing in materials
Other Editions
- Electromigration in thin films and electronic devices: materials and reliability
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