IEEE Standard Test Access Port and Boundary-Scan Architecture
Includes Supplement (Includes Ieee Std 1149.1a-1993, Ieee Standard Test Access Port and Boundary-Scan Architecture)
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Publication
1993-10-01 - Institute of Electrical & Electronics Enginee
Language
English
Word Count
44,000 words, Guess
Page Count
176 pages
Physical Format
Paperback
Identifiers
- ISBN-101559373504
- ISBN-139781559373500
- Open LibraryOL12093691M
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