IEEE standard test access port and boundary-scan architecture
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Author
Contributions
- IEEE Standards Board. - Contributor
- IEEE Computer Society. Test Technology Technical Committee. - Contributor
Publication
1993 - Institute of Electrical and Electronics Engineers, New York, N.Y, New York (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-101559373504
- ISBN-139781559373500
- Open LibraryOL18517033M
Subjects
Topics
Integrated circuits -- Testing -- Standards
Series Statement
- IEEE Std -- 1149.1-1990.
- IEEE Std -- 1149.1a-1993.
Links
Other Editions
- IEEE standard test access port and boundary-scan architecture
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