Microelectronic test pattern NBS-4
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Author
Contributions
- Buehler, Martin G , joint author - Contributor
- Institute for Applied Technology (U.S.). Electronic Technology Division - Contributor
- United States. Defense Advanced Research Projects Agency - Contributor
- United States. National Bureau of Standards - Contributor
Publication
1978 - Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off., Washington, District of Columbia
Language
English
Word Count
19,750 words, Guess
Page Count
79 pages
Identifiers
- Library of Congress Control Number78606190
- OCLC Control Number3839014
- Open LibraryOL14847059M
Subjects
Topics
Series Statement
- Semiconductor measurement technology
- NBS special publication ; 400-32
Other Editions
- Microelectronic test pattern NBS-4
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