Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
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Author
Contributions
- SpringerLink (Online service) - Contributor
Publication
2013 - Springer Berlin Heidelberg, Berlin, Heidelberg, Germany
Language
English
Word Count
157,500 words, Guess
Page Count
630 pages
Physical Format
Electronic resource
Identifiers
- Internet Archivescanningprobemic03peng
- ISBN-139783642254147
- ISBN-103642254144
- Better World Books9783642254147
- Open LibraryOL27086336M
Classifications
- DDC620.5
- LCCQC176.8.N35
- LCCT174.7
Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Subjects
Series Statement
- NanoScience and Technology
Other Editions
- Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
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