Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
28-29 January 2009, San Jose, California, United States
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Publication
2009 - SPIE
Language
English
Word Count
45,000 words, Guess
Page Count
180 pages
Identifiers
- ISBN-139780819474520
- ISBN-100819474525
- Library of Congress Control Number2010287640
- Better World Books9780819474520
- Open LibraryOL28466627M
Classifications
- LCCTK7875.R438 2009
- LCCTK7875 .R438 2009
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