Continuum and lattice theories of influence of electromechanical coupling on capacitance of thin dielectric films
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Author
Contributions
- United States. Office of Naval Research - Contributor
- United States. Army Electronics Command - Contributor
Publication
1969 - Department of Civil Engineering and Engineering Mechanics, Columbia University, New York, New York (State)
Language
English
Word Count
5,500 words, Guess
Page Count
22 pages
Identifiers
- OCLC Control Number11245864
- Open LibraryOL45147145M
Subjects
Series Statement
- Columbia University. Dept. of Civil Engineering and Engineering Mechanics. Technical report -- no. 13
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