Multi-Chip Module Test Strategies
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Word Count
41,750 words, Guess
Page Count
167 pages
Physical Format
Electronic resource
Identifiers
- Internet Archivemultichipmodulet00zori
- ISBN-101461377986
- ISBN-101461561078
- ISBN-139781461377986
- ISBN-139781461561071
and 4 more
- OCLC Control Number851821561
- Better World Books9781461377986
- Better World Books9781461561071
- Open LibraryOL27076124M
Classifications
- DDC621.3815
- LCCTK7888.4
- LCCTK7888.4TK1-9971
and 1 more
- LCCTK7867-7867.5
Description
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Series Statement
- Frontiers in Electronic Testing -- 7
Other Editions
- Multi-Chip Module Test Strategies
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