X-ray Diffraction at Elevated Temperatures
A Method for In Situ Process Analysis
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Publication
1993-02-26 - Wiley
Language
English
Word Count
67,000 words, Guess
Page Count
268 pages
Physical Format
Hardcover
Identifiers
- ISBN-100471187267
- ISBN-139780471187264
- OCLC Control Number228381684
- Better World Books9780471187264
- Open LibraryOL10303756M
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