Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
1 edition
Our rough guess is there are 45,000 words in this book.
At a pace averaging 250 words per minute, this book will take 3 hours and 0 minutes to read. With a half hour per day, this will take 6 days to read.
How long will it take you?
This book will take an estimated to read at a reading speed averaging words per minute. With 30 minutes per day, this will take to read.
Enter your reading speedYou can take one of our WPM reading speed tests to find your reading speed.
Create a free account to track your reading progress, build your reading list, and set reading goals.
Word Count
45,000 words, Guess
Page Count
180 pages
Physical Format
Hardcover
Identifiers
- Internet Archivepowerconstrained00pete
- Internet Archivepowerconstrained00nico_422
- ISBN-10140207235X
- ISBN-139781402072352
- Goodreads4980631
and 4 more
- Library of Congress Control Number2002043306
- OCLC Control Number51242028
- Better World Books9781402072352
- Open LibraryOL8372478M
Classifications
- LCCTK7888.4TK1-9971TA34
- LCCTK7874.75 .N53 2003
First Sentence
The topic of this book is power-constrained testing of very large scale integrated (VLSI) circuits.
Subjects
Topics
Other Editions
- Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Similar Books
Reader Reviews
No reviews yet for this book.
Be the first to share your thoughts!