Tutorial on manufacturing yield evaluation of VLSI/WSI systems
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Author
Contributions
- Ciciani, Bruno. - Contributor
Publication
1994 - IEEE Computer Society Press, Los Alamitos, CA, California
Language
English
Word Count
109,250 words, Guess
Page Count
437 pages
Identifiers
- Open LibraryOL1095642M
- ISBN-100818662905
- OCLC Control Number34971155
- OCLC Control Numbertutorialonmanufa00cici
- Library of Congress Control Number94020185
and 1 more
- Goodreads3475347
Classifications
- DDC621.39/5
- LCCTK7874.75 .T88 1994
Description
Low manufacturing yield and dependability (reliability, availability, and performability) are problems of increasing importance as the densities of integrated circuits increase. This book furnishes you with engineering methodologies so that you can evaluate the cost-benefit ratio of fault-tolerant mechanisms used in VLSI/WSI systems. It focuses in particular on manufacturing fault analysis and yield evaluation. A practical understanding of these concepts and their application can help to reduce the chance of having device failures. This book is divided into five chapters. The first chapter introduces and presents an overview of yield enhancement techniques, manufacturing defect and fault modeling, yield evaluation methodologies, and cost-benefit ratio evaluation methodologies of fault-tolerant mechanisms. Each of the other four chapters contains a collection of papers covering these four research areas. These chapters begin with an introduction to the papers, present abstracts, and provide further references for a complete study of the reprinted papers that follow.
Subjects
Topics
Other Editions
- Tutorial on manufacturing yield evaluation of VLSI/WSI systems
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