Defect Recognition and Image Processing in Semiconductors and Devices
Proceedings of the Fifth International Conference, Santander, Spain, 6-10 Sep (Institute of Physics Conference Series)
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Word Count
104,250 words, Guess
Page Count
417 pages
Physical Format
Hardcover
Identifiers
- ISBN-100750302941
- ISBN-139780750302944
- Goodreads4699641
- Open LibraryOL7970949M
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