An approach to designing stuck-open testable CMOS combinational circuit
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Author
Publication
1990 - State University of New York at Buffalo, Dept. of Computer Science, Buffalo, N.Y, New York (State)
Language
English
Word Count
7,250 words, Guess
Page Count
29 pages
Physical Format
Microform
Identifiers
- OCLC Control Number31433108
- Open LibraryOL22269710M
Subjects
Series Statement
- Technical report (State University of New York at Buffalo. Dept. of Computer Science) -- 90-01
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