Advances and applications in the metallography and characterization of materials and microelectronic components
proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society
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Contributions
- Stevens, D. W. - Contributor
Publication
1996 - ASM International, Columbus, Ohio, Ohio
Language
English
Word Count
79,500 words, Guess
Page Count
318 pages
Identifiers
- ISBN-100871705702
- ISBN-139780871705709
- Library of Congress Control Number96083825
- Open LibraryOL1021753M
Classifications
- DDC669.95 s
- DDC669/.95
- LCCTN689.2 .I552a vol. 23
Subjects
Topics
Series Statement
- Microstructural science ;
- v. 23
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