Lithium drifted p-i-n junctions in silicon.
Particle identification and irradiation effects.
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Word Count
32,500 words, Guess
Page Count
130 pages
Identifiers
- Open LibraryOL4948373M
- OCLC Control Number41919
- Library of Congress Control Number76376338
Classifications
- LCCQC612.S4 A49
Subjects
Topics
DefectsSiliconSilicon.CrystalsSemiconductorsCrystals -- Defects.Effect of radiation onSemiconductors -- Effect of radiation on.
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