Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI
23-24 January 2012, San Francisco, California, United States
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Contributions
- SPIE (Society) - Contributor
- Dyoptyka (Firm) - Contributor
- Vuzix Corporation - Contributor
- Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration - Contributor
Publication
2012 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-100819488933
- ISBN-139780819488930
- Library of Congress Control Number2012405994
- OCLC Control Number799028268
- Better World Books9780819488930
and 1 more
- Open LibraryOL30440974M
Classifications
- DDC621.381
- LCCTK7875 .R438 2012
- LCCQC371 .S67 v. 8250
and 1 more
- LCCTK7875.R438 2012
Series Statement
- Proceedings of SPIE -- v. 8250
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 8250.
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