Designing, testing, and diagnostics--join them
International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
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Contributions
- IEEE Computer Society. Test Technology Technical Committee. - Contributor
- Institute of Electrical and Electronics Engineers. Philadelphia Section. - Contributor
Publication
1993 - Can be ordered from IEEE Service Center, Altoona, PA, Pennsylvania
Language
English
Word Count
266,250 words, Guess
Page Count
1,065 pages
Identifiers
- ISBN-100780314301
- ISBN-100780314298
- ISBN-10078031431X
- ISBN-139780780314306
- ISBN-139780780314290
and 4 more
- ISBN-139780780314313
- Goodreads5079274
- Library of Congress Control Number93080010
- Open LibraryOL1444240M
Classifications
- DDC621.3815/028/7
- LCCTK7874 .I474 1993
Subjects
Genres
- Congresses
Other Editions
- Designing, testing, and diagnostics--join them: International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
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