X-Ray Microscopy II
Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
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Author
Contributions
- Kirz, Janos - Contributor
- Howells, Malcolm - Contributor
- Rarback, Harvey - Contributor
Publication
1988 - Springer Berlin Heidelberg, Berlin, Heidelberg, Germany
Language
English
Word Count
113,750 words, Guess
Page Count
455 pages
Physical Format
[electronic resource] :
Identifiers
- Open LibraryOL27096532M
- ISBN-139783540392460
- ISBN-103540392467
- OCLC Control Number859584370
- OCLC Control Numberxraymicroscopyii1987sayr
Classifications
- DDC621.36
- LCCQC350-467
Series Statement
- Springer Series in Optical Sciences -- 56
Other Editions
- X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
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