2000 IEEE International Reliability Physics Symposium
proceedings : 38th annual : San Jose, California, April 10-13, 2000
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Author
Contributions
- IEEE Electron Devices Society. - Contributor
- IEEE Reliability Society. - Contributor
Publication
2000 - IEEE, Piscataway, New Jersey, New Jersey
Language
English
Word Count
114,000 words, Guess
Page Count
456 pages
Identifiers
- ISBN-100780358600
- ISBN-100780358619
- ISBN-100780358627
- ISBN-139780780358607
- ISBN-139780780358614
and 3 more
- ISBN-139780780358621
- LibraryThing5455967
- Open LibraryOL18175032M
Alternate Titles
- Reliability physics.
- Reliability Physics Symposium, 2000, proceedings, 38th Annual 2000 IEEE International.
Subjects
Topics
Genres
- Congresses
Links
Other Editions
- 2000 IEEE International Reliability Physics Symposium: proceedings : 38th annual : San Jose, California, April 10-13, 2000
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