Design, Analysis and Test of Logic Circuits Under Uncertainty
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Author
Contributions
- Markov, Igor L. (Igor Leonidovich), 1973- - Contributor
- Hayes, John P. (John Patrick), 1944- - Contributor
- SpringerLink (Online service) - Contributor
Publication
2013 - Imprint: Springer, Dordrecht, Netherlands
Language
English
Word Count
34,000 words, Guess
Page Count
136 pages
Physical Format
Electronic resource
Identifiers
- Internet Archivedesignanalysiste00kris
- ISBN-139789048196449
- ISBN-109048196442
- Better World Books9789048196449
- Open LibraryOL27030573M
Classifications
- DDC621.3815
- LCCTK7888.4
- LCCTK7867-7867.5
Subjects
Series Statement
- Lecture Notes in Electrical Engineering -- 115
Other Editions
- Design, Analysis and Test of Logic Circuits Under Uncertainty
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