Scanning force microscopy
with applications to electric, magnetic, and atomic forces
Rev. ed.
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Author
Publication
1994 - Oxford University Press, New York, New York (State)
Language
English
Word Count
65,750 words, Guess
Page Count
263 pages
Identifiers
- Open LibraryOL1079737M
- ISBN-10019509204X
- OCLC Control Number29877910
- OCLC Control Numberscanningforcemic00sari_565
- Library of Congress Control Number94003081
and 2 more
- LibraryThing8249964
- Goodreads4786537
Classifications
- DDC502/.8/2
- LCCQH212.S32 S27 1994
Subjects
Topics
Series Statement
- Oxford series in optical and imaging sciences ;
Other Editions
- Scanning force microscopy: with applications to electric, magnetic, and atomic forces
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