Electron Probe Microanalyser Used For Determining the X-Ray Emission Distribution in Carbon and the Thickness of Carbon Films on Metal Surfaces.
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Contributions
- Sawatzky, A. - Contributor
- Jones, S. - Contributor
Publication
1971 - s.n, S.l
Language
English
Subjects
Series Statement
- Atomic Energy of Canada Limited. AECL -- 3959
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