Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford
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Word Count
76,000 words, Guess
Page Count
304 pages
Physical Format
Hardcover
Identifiers
- Open LibraryOL11603638M
- ISBN-139780852743980
- ISBN-10085274398X
- OCLC Control Number17916834
- OCLC Control Numberyieldmodellingde0000inte
and 1 more
- Library of Congress Control Number88014068
Classifications
- LCCTK7874.I475 1987
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