Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes
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Author
Contributions
- U.S. Atomic Energy Commission. - Contributor
Publication
1975 - U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., Washington, District of Columbia
Language
English
Word Count
5,000 words, Guess
Page Count
20 pages
Identifiers
- Open LibraryOL5183343M
- OCLC Control Number1177659
- Library of Congress Control Number75001210
Classifications
- DDC389/.08 s
- LCCQC100 .U57 no. 400-13
Subjects
Topics
Series Statement
- Semiconductor measurement technology
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