Reliability of Nanoscale Circuits and Systems
Methodologies and Circuit Architectures
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Publication
2010 - Springer
Language
English
Word Count
48,750 words, Guess
Page Count
195 pages
Identifiers
- ISBN-139781441962171
- ISBN-101441962174
- Better World Books9781441962171
- Open LibraryOL34462538M
Classifications
- LCCTA1-2040
Subjects
Other Editions
- Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
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