Defects and properties of semiconductors
defect engineering
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Author
Contributions
- Chikawa, J. 1930- - Contributor
- Sumino, K. 1931- - Contributor
- Wada, K. 1950- - Contributor
- Society of Non-Traditional Technology (Japan) - Contributor
- Symposium on "Defects and Qualities of Semiconductors" (1984 : Tokyo, Japan) - Contributor
Publication
1987 - KTK Scientific, Tokyo
Language
English
Word Count
65,250 words, Guess
Page Count
261 pages
Identifiers
- Open LibraryOL2728074M
- ISBN-109027723524
- OCLC Control Number14167049
- OCLC Control Numberdefectspropertie0000unse
- Library of Congress Control Number86021992
and 1 more
- Goodreads3575211
Classifications
- DDC621.3815/2
- LCCQC611.6.D4 D4184 1987
Series Statement
- Advances in solid state technology ;
Other Editions
- Defects and properties of semiconductors: defect engineering
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