Metal-dielectric interfaces in gigascale electronics
thermal and electrical stability
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Author
Contributions
- Lu, T.-M. (Toh-Ming), 1943- - Contributor
Publication
2012 - Springer, New York, New York (State)
Language
English
Word Count
37,250 words, Guess
Page Count
149 pages
Identifiers
- Open LibraryOL25269964M
- ISBN-139781461418115
- ISBN-101461418119
- OCLC Control Number776675131
- OCLC Control Numbermetaldielectrici00hemi
and 1 more
- Library of Congress Control Number2011941622
Classifications
- DDC621.381
- LCCTK7874 .H3945 2012
Subjects
Topics
MaterialsChemistryElectronicsEngineeringDielectricsMicroelectronicsElectrochemistryOptical materialsPhysical sciencesIntegrated circuitsElectronic circuitsInterfaces (Physical sciences)Optical and Electronic MaterialsNanotechnology and MicroengineeringThin Films Surface and Interface ScienceInstrumentation Electronics and MicroelectronicsHeat and Mass Transfer Engineering Thermodynamics
Series Statement
- Springer series in materials science -- v. 157
Other Editions
- Metal-dielectric interfaces in gigascale electronics: thermal and electrical stability
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