Cher Ming Tan

Identifiers

Open LibraryOL7560216A

Top Subjects

Engineering (2)
Diffusion (1)
Integrated circuits, ultra large scale integration (1)
Atomic, Molecular, Optical and Plasma Physics (1)
System safety (1)
Quality Control, Reliability, Safety and Risk (1)
Electronic Circuits and Devices (1)

Books by Cher Ming Tan

Total count: 8

Electromigration in Ulsi Interconnections

World Scientific Publishing Co Pte Ltd2010-01-01
Electromigration Modeling at Circuit Layout Level

Imprint: Springer2013-01-01
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Springer2013-04-19
Theory and Practice of Quality and Reliability Engineering in Asia Industry

Springer2017-01-26
Graphene and Ulsi Interconnects

Taylor & Francis Group2021-01-01
Graphene and VLSI Interconnects

Jenny Stanford Publishing2021-01-01
Reliability and Failure Analysis of High Power LED Packaging

Woodhead Publishing2021-11-15
Reliability Analysis of Electrotechnical Devices

Mdpi AG2022-07-20