Cher Ming Tan

Electromigration in Ulsi Interconnections

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Author

Cher Ming Tan

Publication

2010 - World Scientific Publishing Co Pte Ltd

Language

English

Word Count

0 words, Guess

Page Count

0 pages

Identifiers

ISBN-139789814273336
ISBN-109814273333
Better World Books9789814273336
Open LibraryOL49247775M

Subjects

Topics

Diffusion Integrated circuits, ultra large scale integration

Other Editions

Electromigration in Ulsi InterconnectionsWorld Scientific Publishing Co Pte Ltd2010-01-01

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