Topic

Impurity distribution

24 books

The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties (Techniques of Physics) cover

The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties (Techniques of Physics)

J. W. Orton, P. Blood

Optical absorption of impurities and defects in semiconducting crystals: hydrogen-like centres cover

Optical absorption of impurities and defects in semiconducting crystals: hydrogen-like centres

Bernard Pajot

Shallow Impurities in Semiconductors, Proceedings of the 3rd INT  Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series) cover

Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series)

Monemar

Defect and impurity engineered semiconductors and devices: symposium held April 17-21, 1995, San Francisco, California, U.S.A. cover

Defect and impurity engineered semiconductors and devices: symposium held April 17-21, 1995, San Francisco, California, U.S.A.

editors, S. Ashok ... [et al.].

Defect and impurity engineered semiconductors II: symposium held April 13-17, 1998, San Francisco, California, U.S.A. cover

Defect and impurity engineered semiconductors II: symposium held April 13-17, 1998, San Francisco, California, U.S.A.

editors, S. Ashok ... [et al.].

DISTRIB I, an impurity redistribution computer program

David Gilsinn and Richard Kraft.

Shallow-Level Centers in Semiconductors: Proceedings of the 7th International Conference

C.A.J. Ammerlaan

Molekuli͡a︡rnai͡a︡, lazernai͡a︡ ėpitaksii͡a︡: raspredelenie primeseĭ i defektov

otvetstvennyĭ redaktor L.N. Aleksandrov.

Impurities, defects, and diffusion in semiconductors: bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. cover

Impurities, defects, and diffusion in semiconductors: bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.

editors, Donald J. Wolford, Jerzy Bernholc, Eugene E. Haller.

Effects of heavy doping and metallic contamination on electrical characteristics of semiconductor devices cover

Effects of heavy doping and metallic contamination on electrical characteristics of semiconductor devices

by Ker-Wen Teng

Showing 10 of 24 books

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