Author

Contributions

  • Kraft, Richard, joint author. - Contributor

Publication

1979 - U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., Washington, District of Columbia

Language

English

Word Count

30,500 words, Guess

Page Count

122 pages

Identifiers

Classifications

  • DDC602/.18 s
  • DDC621.3815/2
  • LCCQC100 .U57 no. 400-57
and 1 more
  • LCCTK7871.85 .U57 no. 400-57

Subjects

Topics

SiliconDISTRIB IOxidationSemiconductorsData processingMathematical modelsImpurity distribution

Series Statement

  • Semiconductor measurement technology
  • National Bureau of Standards special publication ; 400-57
  • NBS special publication ;
  • 400-57.

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