Integrated circuits -- Testing

ESD: circuits and devices

Steven H. Voldman.

Analog test signal generation using periodic [sigma delta]-encoded data streams

by Benoit Dufort and Gordon W. Roberts.

Integrated Circuit Manufacturability: The Art of Process and Design Integration

Dhiraj Pradhan

Integrated circuit design, fabrication, and test

Peter Shepherd.

Failure analysis of integrated circuits: tools and techniques

edited by Lawrence C. Wagner.

Analog signal generation for built-in-self-test of mixed-signal integrated circuits

by Gordon W. Roberts, Albert K. Lu.

Thermal testing of integrated circuits

by Josep Altet and Antonio Rubio.

Latch-up and radiation integrated circuit -- LURIC: a test chip for CMOS latch-up investigation

Donald B. Estreich, Computer-Aided Design Division 2113, Sandia Laboratories ; prepared by Sandia Laboratories for the United States Department of Energy.

Termodinamicheskie osnovy diagnostiki i nadezhnosti mikroėlektronnykh ustroĭstv

V.L. Vorobʹev.

Logicheskie metody v zadachakh diagnoza: [Sb. stateĭ]

AN SSSR, Dalʹnevost. nauch. t͡s︡entr, In-t avtomatiki i prot͡s︡essov upr. ; [Otv. red. V.P. Chipulis].