Thermal testing of integrated circuits
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Author
Contributions
- Rubio, Antonio, 1954- - Contributor
Publication
2002 - Springer, Boston, Massachusetts
Language
English
Word Count
51,000 words, Guess
Page Count
204 pages
Identifiers
- Internet Archivethermaltestingof0000alte
- ISBN-101402070764
- ISBN-139781402070761
- Goodreads1661068
- Library of Congress Control Number2002030050
and 3 more
- Better World Books9781402070761
- Better World BooksP7-AZV-351
- Open LibraryOL3562660M
Classifications
- DDC621.3815/028/7
- LCCTK7874 .A44 2002
- LCCTK7867-7867.5
Subjects
Topics
TestingThermal propertiesIntegrated circuitsTemperature measurementsIntegrated circuits -- TestingIntegrated circuits -- Thermal properties
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