Transmission electron microscopy and diffractometry of materials
2nd ed.
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Author
Contributions
- Howe, James M., 1955- - Contributor
Publication
2002 - Springer, Berlin, Germany
Language
English
Word Count
187,000 words, Guess
Page Count
748 pages
Identifiers
- ISBN-103540437649
- ISBN-139783540437642
- LibraryThing348720
- Library of Congress Control Number2002070720
- OCLC Control Number50002266
and 1 more
- Open LibraryOL18208311M
Classifications
- LCCTA417.23 .F85 2002
Subjects
Topics
ScienceImagingPhysicsMaterialsMicroscopyDiffractionSpectroscopyNanostructuresMaterial ScienceScience/MathematicsElectron MicroscopyX-ray diffractometerTesting Of MaterialsEngineering - GeneralMaterials -- MicroscopyMaterials characterizationTechnology / Material ScienceTransmission electron microscoTransmission electron microscopyApplied physics & special topicsElectron Microscopes & Microscopy
Other Editions
- Transmission electron microscopy and diffractometry of materials
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