Spectroscopic characterization techniques for semiconductor technology
9-10 November 1983, Cambridge, Massachusetts
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Author
Contributions
- Pollak, Fred H. - Contributor
- Bauer, Robert S. - Contributor
- Society of Photo-Optical Instrumentation Engineers. - Contributor
Publication
1984 - SPIE--the International Society for Optical Engineering, Bellingham, Wash., USA, Washington (State)
Language
English
Word Count
50,750 words, Guess
Page Count
203 pages
Identifiers
- Internet Archivespectroscopiccha0000unse_i7p4
- ISBN-100892524871
- ISBN-139780892524877
- Goodreads5610215
- Library of Congress Control Number83051560
and 1 more
- Open LibraryOL15180790M
Subjects
Other Editions
- Spectroscopic characterization techniques for semiconductor technology: 9-10 November 1983, Cambridge, Massachusetts
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