Fred H. Pollak

Identifiers

Open LibraryOL3040272A

Top Subjects

Congresses (3)
Spectrum analysis (2)
Semiconductors (2)
Testing (2)
Optical Engineering (1)
Science (1)
Crystallography (1)

Books by Fred H. Pollak

Total count: 3

Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452)

SPIE--the International Society for Optical Engineering1984-02-01
Spectroscopic Characterization Techniques for Semiconductor Technology III14-15 March 1988, Newport Beach, California (Proceedings of Spie--the)

Society of Photo Optical1988-09-01
Layered Structures: Heteroepitaxy, Superlattices, Strain and MetastabilitySymposium Held November 27-December 1, 1989, Boston, Massachusetts, U.S. (Materials Research Society Symposium Proceedings)

Materials Research Society1990-04-01