Spectroscopic characterization techniques for semiconductor technology III
14-15 March 1988, Newport Beach, California
Our rough guess is there are 58,500 words in this book.
At a pace averaging 250 words per minute, this book will take 3 hours and 54 minutes to read. With a half hour per day, this will take 8 days to read.
How long will it take you?
This book will take an estimated to read at a reading speed averaging words per minute. With 30 minutes per day, this will take to read.
Enter your reading speedYou can take one of our WPM reading speed tests to find your reading speed.
Create a free account to track your reading progress, build your reading list, and set reading goals.
We earn a commission on purchases
Contributions
- Glembocki, O. J. - Contributor
- Pollak, Fred H. - Contributor
- Ponce, Fernando. - Contributor
- Optical Society of America. - Contributor
- Society of Photo-optical Instrumentation Engineers. - Contributor
and 1 more
- Metallurgical Society (U.S.) - Contributor
Publication
1988 - SPIE, Bellingham, Wash., USA, Washington (State)
Language
English
Word Count
58,500 words, Guess
Page Count
234 pages
Identifiers
- Open LibraryOL15192894M
- ISBN-100892529814
- OCLC Control Number261574259
- OCLC Control Numberisbn_0892529814_946
- Library of Congress Control Number88060787
and 1 more
- Goodreads4214533
Subjects
Series Statement
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 946
Other Editions
- Spectroscopic characterization techniques for semiconductor technology III: 14-15 March 1988, Newport Beach, California
Reader Reviews
No reviews yet for this book.
Be the first to share your thoughts!