Materials, technology, and reliability for advanced interconnects and low-k dielectrics--2004
symposium held April 13-15, 2004, San Francisco, California, U.S.A
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Author
Contributions
- Carter, R. J. 1948- - Contributor
- Materials Research Society. Meeting - Contributor
- Symposim on Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics (2004 : San Francisco, Calif.) - Contributor
Publication
2004 - Materials Research Society, Warrendale, Pa, Pennsylvania
Language
English
Word Count
100,500 words, Guess
Page Count
402 pages
Identifiers
- Open LibraryOL3329198M
- ISBN-101558997628
- OCLC Control Number56554790
- OCLC Control Number506484438
- Library of Congress Control Number2004304216
and 1 more
- Goodreads5122481
Classifications
- DDC621.8/672
- LCCTK7871.85 .M367832 2004
Subjects
Topics
Genres
- Congresses.
Series Statement
- Materials Research Society symposium proceedings ;
Other Editions
- Materials, technology, and reliability for advanced interconnects and low-k dielectrics--2004
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