Evaluation of advanced semiconductor materials by electron microscopy
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Contributions
- Cherns, David. - Contributor
- North Atlantic Treaty Organization. Scientific Affairs Division. - Contributor
- Special Program on Condensed Systems of Low Dimensionality (NATO) - Contributor
Publication
1989 - Plenum Press, New York, New York (State)
Language
English
Word Count
103,000 words, Guess
Page Count
412 pages
Identifiers
- Open LibraryOL2196697M
- ISBN-100306433621
- ISBN-139780306433627
- Goodreads4835299
- Library of Congress Control Number89016354
Classifications
- DDC530.4/1
- LCCQC611.6.S9 N36 1988
Subjects
Topics
SurfacesElectronsTechniqueCongressesDiffractionSemiconductorsElectron microscopyElectrons -- Diffraction -- CongressesSemiconductors -- Surfaces -- CongressesElectron microscopy -- Technique -- Congresses
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