Measurement of carrier lifetime in semiconductors
an annotated bibliography covering the period 1949-1967
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Author
Publication
1968 - U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off., Washington, District of Columbia
Language
English
Word Count
15,500 words, Guess
Page Count
62 pages
Identifiers
- Library of Congress Control Number71600484
- Open LibraryOL5275375M
Classifications
- DDC016.621381/52
- LCCQC100 .U5753 no. 465
Subjects
Series Statement
- National Bureau of Standards. NBS technical note 465
- NBS technical note ;
- 465.
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