W. Murray Bullis

Born 1930-01-01

Identifiers

Open LibraryOL627288A

Top Subjects

Semiconductors (2)
Semiconductors -- Bibliography (1)
Integrated circuits -- Testing. (1)
Semiconductors -- Testing. (1)
Integrated circuits -- Measurement. (1)
Semiconductors -- Measurement. (1)
Silicon (1)

Books by W. Murray Bullis

Total count: 6

Measurement of carrier lifetime in semiconductorsan annotated bibliography covering the period 1949-1967

U.S. National Bureau of Standards; for sale by the Supt of Docs., U.S. Govt. Print. Off.1968-01-01
Measurement methods for the semiconductor device industry - a summary of NBS activity

for sale by the Supt. of Docs., U.S. Govt. Print. Off.1969-01-01
Metrology for submicrometer devices and circuits

U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.1980-01-01
Evolution of silicon materials characterizationlessons learned for improved manufacturing

For sale by the Supt. of Docs., U.S. G.P.O.1993-01-01
Semiconductor measurement technologyevolution of silicon materials characterization : lessons learned for improved manufacturing

U.S. Dept. of Commerce, National Institute of Standards and Technology1993-01-01
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology1995-01-01