Semiconductor measurement technology
evolution of silicon materials characterization : lessons learned for improved manufacturing
Our rough guess is there are 52,750 words in this book.
At a pace averaging 250 words per minute, this book will take 3 hours and 31 minutes to read. With a half hour per day, this will take 7 days to read.
How long will it take you?
This book will take an estimated to read at a reading speed averaging words per minute. With 30 minutes per day, this will take to read.
Enter your reading speedYou can take one of our WPM reading speed tests to find your reading speed.
Create a free account to track your reading progress, build your reading list, and set reading goals.
Author
Contributions
- National Institute of Standards and Technology (U.S.). Semiconductor Electronics Division. - Contributor
Publication
1993 - U.S. Dept. of Commerce, National Institute of Standards and Technology, Gaithersburg, MD, Maryland
Language
English
Word Count
52,750 words, Guess
Page Count
211 pages
Physical Format
Microform
Identifiers
- Open LibraryOL14698451M
Alternate Titles
- Evolution of silicon materials characteristics, lessons learned for improved manufacturing.
Subjects
Topics
Places
Series Statement
- NIST special publication -- 400-92.
Other Editions
- Semiconductor measurement technology: evolution of silicon materials characterization : lessons learned for improved manufacturing
Reader Reviews
No reviews yet for this book.
Be the first to share your thoughts!