Scanning microscopy 2010
17-19 May 2010, Monterey, California, United States
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Author
Contributions
- SPIE (Society) - Contributor
- National Institute of Standards and Technology (U.S.) - Contributor
Publication
2010 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-10081948217X
- ISBN-139780819482174
- Library of Congress Control Number2010459471
- OCLC Control Number656784720
- Open LibraryOL24883248M
Classifications
- DDC570.28/25
- LCCQH212.S3 .S345 2010
- LCCQH212.S3 S345 2010
Subjects
Series Statement
- Proceedings of SPIE -- v. 7729
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 7729.
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