Michael T. Postek

Identifiers

Open LibraryOL3545047A

Top Subjects

Congresses (4)
Scanning electron microscopes (4)
Nanotechnology (3)
Science/Mathematics (2)
Microfabrication (2)
Nanostructured materials (2)
Technology & Industrial Arts (1)

Books by Michael T. Postek

Total count: 14

Integrated Circuit Metrology, Inspection, and Process Control VI9-11 March 1992 San Jose, California (Proceedings of S P I E)

SPIE-International Society for Optical Engine1992-05-01
Integrated Circuit Metrology, Inspection, And Process Control VII

Society of Photo Optical1993-01-01
Instrumentation, metrology, and standards for nanomanufacturing II10 August 2008, San Diego, California, USA

SPIE2008-01-01
Scanning microscopy 20094-7 May 2009, Monterey, California, United States

SPIE2009-01-01
Scanning microscopy 20094-7 May 2009, Monterey, California, United States

SPIE2009-01-01
Instrumentation, metrology, and standards for nanomanufacturing III3-5 August 2009, San Diego, California, United States

SPIE2009-01-01
Instrumentation, metrology, and standards for nanomanufacturing III3-5 August 2009, San Diego, California, United States

SPIE2009-01-01
Scanning microscopy 201017-19 May 2010, Monterey, California, United States

SPIE2010-01-01
Instrumentation, metrology, and standards for nanomanufacturing IV2-4 August 2010, San Diego, California, United States

SPIE2010-01-01
Scanning microscopies 2011advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States

SPIE2011-01-01
New research in nanotechnology

Nova Science Publisher's2011-01-01
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V24-25 August 2011, San Diego, California, United States

SPIE2011-01-01
Scanning Microscopies 2012Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

SPIE2012-01-01
Scanning Microscopies 2015

SPIE2015-01-01