Scanning microscopy 2009
4-7 May 2009, Monterey, California, United States
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Author
Contributions
- SPIE (Society) - Contributor
- National Institute of Standards and Technology (U.S.) - Contributor
Publication
2009 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-100819476544
- ISBN-139780819476548
- Library of Congress Control Number2010455662
- OCLC Control Number316831517
- Open LibraryOL24416052M
Classifications
- DDC570.28/25
- LCCQH212.S3 .S344 2009
Subjects
Series Statement
- Proceedings of SPIE -- v. 7378
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 7378.
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