Scanning microscopies 2011
advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States
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Author
Contributions
- SPIE (Society) - Contributor
Publication
2011 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-100819486108
- ISBN-139780819486103
- Library of Congress Control Number2011499441
- OCLC Control Number746464542
- Open LibraryOL30643125M
Classifications
- DDC570.28/25
- LCCQH212.S3 S32 2011
Subjects
Series Statement
- Proceedings of SPIE -- v. 8036
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