Instrumentation, metrology, and standards for nanomanufacturing III
3-5 August 2009, San Diego, California, United States
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Author
Contributions
- National Institute of Standards and Technology (U.S.) - Contributor
- SPIE (Society) - Contributor
Publication
2009 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-100819476951
- ISBN-139780819476951
- Library of Congress Control Number2010286669
- OCLC Control Number457890329
- Open LibraryOL24480388M
Classifications
- DDC620/.5
- LCCTA418.9.N35 I568 2009
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