Materials, technology and reliability for advanced interconnects and low-k dielectrics
symposium held April 23-27, 2000, San Fransico, California, U.S.A.
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Author
Publication
2001 - Materials Research Society, Warrendale, Pa, Pennsylvania
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-10155899520X
- ISBN-139781558995208
- Library of Congress Control Number00069552
- OCLC Control Number47222899
- Open LibraryOL19019825M
Subjects
Topics
MaterialsJunctionsCongressesReliabilityDielectricsSemiconductorsDielectric filmsIntegrated circuitsMaterials, researchSemiconductors -- CongressesDielectric films -- CongressesSemiconductors -- Junctions -- CongressesIntegrated circuits -- Materials -- CongressesIntegrated circuits -- Reliability -- Congresses
Genres
- Congresses
Other Editions
- Materials, technology and reliability for advanced interconnects and low-k dielectrics: symposium held April 23-27, 2000, San Fransico, California, U.S.A.
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