Defect oriented testing for CMOS analog and digital circuits
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Word Count
77,000 words, Guess
Page Count
308 pages
Identifiers
- Internet Archivedefectorientedte00sach
- Internet Archivedefectorientedte0000sach
- ISBN-100792380835
- ISBN-139780792380832
- Goodreads5551107
Classifications
- DDC621.3815
- LCCTK7871.99.M44 S23 1998
Subjects
Topics
TestenDefectsTestingCMOS-SchaltungLinear integrated circuitsDigital integrated circuitsLinear integrated circuits -- TestingDigital integrated circuits -- TestingComplementary Metal oxide semiconductorsMetal oxide semiconductors, ComplementaryMetal oxide semiconductors, Complementary -- DefectsMetal oxide semiconductors, Complementary -- Testing
Series Statement
- Frontiers in electronic testing
Other Editions
- Defect oriented testing for CMOS analog and digital circuits
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