Manoj Sachdev

Identifiers

Open LibraryOL398968A

Top Subjects

Integrated circuits (2)
Metal oxide semiconductors, complementary (2)
Digital integrated circuits -- Testing (1)
Metal oxide semiconductors, Complementary -- Defects (1)
Metal oxide semiconductors, Complementary -- Testing (1)
Linear integrated circuits -- Testing (1)
Defects (1)

Books by Manoj Sachdev

Total count: 7

Defect oriented testing for CMOS analog and digital circuits

Kluwer Academic1998-01-01
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, CanadaProceedings

Institute of Electrical & Electronics Enginee2000-08-01
Thermal and Power Management of Integrated Circuits (Series on Integrated Circuits and Systems)

Springer2006-01-04
Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)

Springer2006-06-01
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Springer London, Limited2007-01-01
ESD Protection Device and Circuit Design for Advanced CMOS Technologies

Springer2008-01-01
Thermal and Power Management of Integrated Circuits

Springer2010-11-29